Efficient tests for realistic faults in dual-port SRAMs
نویسندگان
چکیده
منابع مشابه
Efficient Tests for Realistic Faults in Dual-Port SRAMs
ÐThis paper begins with an overview of realistic fault models for dual-port memories, divided into single-port faults and faults unique for dual-port memories. The latter faults cannot be detected with the conventional single-port memory tests; they require special tests. A precise notation for all faults, such that ambiguities and misunderstandings will be prevented, has been emphasized. Next,...
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Among the different types of algorithms proposed to test Static Random Access Memories (SRAMs), March Tests have proven to be faster, simpler and regularly structured. A large number of March Tests with different fault coverage have been published. Usually different march tests detect only a specific set of memory faults. The always growing memory production technology introduces new classes of...
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The testability problem of dual port memories is investigated. Architectural modifications to enhance the testability by allowing multiple access of memory cells with minimal overhead on both silicon area and device performance are described. New fault models are proposed and efficient O( n ) test algorithms are described for both the memory array and the address decoders. The new fault models ...
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ژورنال
عنوان ژورنال: IEEE Transactions on Computers
سال: 2002
ISSN: 0018-9340
DOI: 10.1109/tc.2002.1004586